New super-resolution technologies, such as stimulated emission depletion microscopy, light-activated positioning microscopy and random optical reconstruction microscopy, have reduced the resolution from 100–200nm to even lower. The piezoelectric objective scanner with nano meter resolution is very suitable for these applications. The alignment of the microscope and the sample holder requires precise and fast movement. The piezoelectric objective scanner driven by high-resolution piezoelectric ceramics can provide unique ultra-precision technical support. P72 series piezoelectric objective scanner is specially designed for microscope applications. It is designed with a non-backlash flexible hinge parallel guide mechanism. It is frictionless and has extremely high resolution, small compensation, and ultra-high focus stability, which is very suitable sample adjustment, beam alignment and beam tracking applications. Features Z axis motion 100μm travel range 3nm resolution Unload resonant f
Application of Piezoelectric Objective Scanner in Microscope.
25 апреля 202425 апр 2024
2 мин